KIST researchers develop a non-destructive method to inspect OLED emitters using terahertz waves
Researchers from the Korea Institute of Science and Technology (KIST) suggest a new method to inspect OLED emitter materials, using terahertz wave spectroscopy.
The researchers say that this method can be used to analyze the transmission characteristics of the OLEDs, without any damage to the materials. This is unlike current fluorescence test methods that harm the OLEDs because of the ultraviolet rays which changes the characteristics.